Automating Real-Time Data Analysis with Machine Learning Algorithms

Sonali P. Bhoite; Satendra Singh; Preeti Naval; M. V. Panduranga Rao; Bharat Bhushan; G. Indira

doi:10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms

Sonali P. Bhoite
, Satendra Singh
, Preeti Naval
, M. V. Panduranga Rao
, Bharat Bhushan
, G. Indira

Producción científica: Libro o Capítulo del libro › Contribución a la conferencia › revisión exhaustiva

Resumen

Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

Idioma original	Inglés estadounidense
Título de la publicación alojada	2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023
Editorial	Institute of Electrical and Electronics Engineers Inc.
ISBN (versión digital)	9798350319125
DOI	https://doi.org/10.1109/SMARTGENCON60755.2023.10442620
Estado	Indizado - 2023
Publicado de forma externa	Sí
Evento	3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 - Bangalore, India Duración: 29 dic. 2023 → 31 dic. 2023

Serie de la publicación

Nombre	2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

Conferencia

Conferencia	3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023
País/Territorio	India
Ciudad	Bangalore
Período	29/12/23 → 31/12/23

Nota bibliográfica

Publisher Copyright:
© 2023 IEEE.

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10.1109/SMARTGENCON60755.2023.10442620

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Bhoite, S. P., Singh, S., Naval, P., Panduranga Rao, M. V., Bhushan, B., & Indira, G. (2023). Automating Real-Time Data Analysis with Machine Learning Algorithms. En 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SMARTGENCON60755.2023.10442620

Bhoite, Sonali P. ; Singh, Satendra ; Naval, Preeti et al. / Automating Real-Time Data Analysis with Machine Learning Algorithms. 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023).

@inproceedings{cf49feaad5cb4741a0f9936c249af50a,

title = "Automating Real-Time Data Analysis with Machine Learning Algorithms",

abstract = "Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.",

keywords = "Algorithms, Anomalies, Applying, Leveraging, Operations",

author = "Bhoite, \{Sonali P.\} and Satendra Singh and Preeti Naval and \{Panduranga Rao\}, \{M. V.\} and Bharat Bhushan and G. Indira",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 ; Conference date: 29-12-2023 Through 31-12-2023",

year = "2023",

doi = "10.1109/SMARTGENCON60755.2023.10442620",

language = "American English",

series = "2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023",

address = "United States",

}

Bhoite, SP, Singh, S, Naval, P, Panduranga Rao, MV, Bhushan, B & Indira, G 2023, Automating Real-Time Data Analysis with Machine Learning Algorithms. En 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023, Institute of Electrical and Electronics Engineers Inc., 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023, Bangalore, India, 29/12/23. https://doi.org/10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms. / Bhoite, Sonali P.; Singh, Satendra; Naval, Preeti et al.
2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023).

Producción científica: Libro o Capítulo del libro › Contribución a la conferencia › revisión exhaustiva

TY - GEN

T1 - Automating Real-Time Data Analysis with Machine Learning Algorithms

AU - Bhoite, Sonali P.

AU - Singh, Satendra

AU - Naval, Preeti

AU - Panduranga Rao, M. V.

AU - Bhushan, Bharat

AU - Indira, G.

PY - 2023

Y1 - 2023

N2 - Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

AB - Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

KW - Algorithms

KW - Anomalies

KW - Applying

KW - Leveraging

KW - Operations

UR - https://www.scopus.com/pages/publications/85187561013

U2 - 10.1109/SMARTGENCON60755.2023.10442620

DO - 10.1109/SMARTGENCON60755.2023.10442620

M3 - Conference contribution

AN - SCOPUS:85187561013

T3 - 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

BT - 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

Y2 - 29 December 2023 through 31 December 2023

ER -

Bhoite SP, Singh S, Naval P, Panduranga Rao MV, Bhushan B, Indira G. Automating Real-Time Data Analysis with Machine Learning Algorithms. En 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023). doi: 10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms

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