Automating Real-Time Data Analysis with Machine Learning Algorithms

Sonali P. Bhoite; Satendra Singh; Preeti Naval; M. V. Panduranga Rao; Bharat Bhushan; G. Indira

doi:10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms

Sonali P. Bhoite
, Satendra Singh
, Preeti Naval
, M. V. Panduranga Rao
, Bharat Bhushan
, G. Indira

Research output: Chapter in Book/Report › Conference contribution › peer-review

Abstract

Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

Original language	American English
Title of host publication	2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9798350319125
DOIs	https://doi.org/10.1109/SMARTGENCON60755.2023.10442620
State	Indexed - 2023
Externally published	Yes
Event	3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 - Bangalore, India Duration: 29 Dec 2023 → 31 Dec 2023

Publication series

Name	2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

Conference

Conference	3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023
Country/Territory	India
City	Bangalore
Period	29/12/23 → 31/12/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

Algorithms
Anomalies
Applying
Leveraging
Operations

Access to Document

10.1109/SMARTGENCON60755.2023.10442620

Cite this

Bhoite, S. P., Singh, S., Naval, P., Panduranga Rao, M. V., Bhushan, B., & Indira, G. (2023). Automating Real-Time Data Analysis with Machine Learning Algorithms. In 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SMARTGENCON60755.2023.10442620

Bhoite, Sonali P. ; Singh, Satendra ; Naval, Preeti et al. / Automating Real-Time Data Analysis with Machine Learning Algorithms. 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023).

@inproceedings{cf49feaad5cb4741a0f9936c249af50a,

title = "Automating Real-Time Data Analysis with Machine Learning Algorithms",

abstract = "Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.",

keywords = "Algorithms, Anomalies, Applying, Leveraging, Operations",

author = "Bhoite, \{Sonali P.\} and Satendra Singh and Preeti Naval and \{Panduranga Rao\}, \{M. V.\} and Bharat Bhushan and G. Indira",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023 ; Conference date: 29-12-2023 Through 31-12-2023",

year = "2023",

doi = "10.1109/SMARTGENCON60755.2023.10442620",

language = "American English",

series = "2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

booktitle = "2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023",

address = "United States",

}

Bhoite, SP, Singh, S, Naval, P, Panduranga Rao, MV, Bhushan, B & Indira, G 2023, Automating Real-Time Data Analysis with Machine Learning Algorithms. in 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023, Institute of Electrical and Electronics Engineers Inc., 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023, Bangalore, India, 29/12/23. https://doi.org/10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms. / Bhoite, Sonali P.; Singh, Satendra; Naval, Preeti et al.
2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023).

Research output: Chapter in Book/Report › Conference contribution › peer-review

TY - GEN

T1 - Automating Real-Time Data Analysis with Machine Learning Algorithms

AU - Bhoite, Sonali P.

AU - Singh, Satendra

AU - Naval, Preeti

AU - Panduranga Rao, M. V.

AU - Bhushan, Bharat

AU - Indira, G.

PY - 2023

Y1 - 2023

N2 - Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

AB - Device getting-to-know algorithms enable the automation of actual-time information analysis, permitting agencies to behave on well-timed insights and optimize selection-making. By leveraging predictive models, companies can increase customized services, optimize operations, and obtain a competitive area. This paper discusses how device learning algorithms can automate real-time facts evaluation and the ways such algorithms can be used to uncover developments, locate anomalies, and enhance models. Moreover, the paper explores how applying device mastering algorithms can boost accuracy and efficiency in data evaluation, in addition to providing businesses with new opportunities for innovation.

KW - Algorithms

KW - Anomalies

KW - Applying

KW - Leveraging

KW - Operations

UR - https://www.scopus.com/pages/publications/85187561013

U2 - 10.1109/SMARTGENCON60755.2023.10442620

DO - 10.1109/SMARTGENCON60755.2023.10442620

M3 - Conference contribution

AN - SCOPUS:85187561013

T3 - 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

BT - 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023

Y2 - 29 December 2023 through 31 December 2023

ER -

Bhoite SP, Singh S, Naval P, Panduranga Rao MV, Bhushan B, Indira G. Automating Real-Time Data Analysis with Machine Learning Algorithms. In 2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (2023 3rd International Conference on Smart Generation Computing, Communication and Networking, SMART GENCON 2023). doi: 10.1109/SMARTGENCON60755.2023.10442620

Automating Real-Time Data Analysis with Machine Learning Algorithms

Abstract

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Conference

Bibliographical note

Keywords

Access to Document

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Cite this